ICP-AES法测定矿石及原料中痕量钒钛
DETERMINATION OF TRACE VANADIUM AND TITANIUM IN ORES AND MATERIALS BY ICP-AES
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摘要: 采用ICP-AES光谱法,通过大量基体元素对钒、钛的谱线干扰试验研究,选取了钒310.230nm,钛334.940nm两条谱线作为测定谱线,并通过K系数校正法和基体匹配的办法,消除了基体干扰和光谱干扰。可测定大于0.001%的钒,0.0005%的钛相对标准偏差分别小于5%,3%。Abstract: Experimental study was conducted of the interference effects of a number of matrix elements on V and Ti spectrum using ICP-AES spectrographic analysis. V 310.230 nm and Ti 334. 940urn were selected as the two measurement spectrum lines,and K coefficient correction and matrix adaptation methods were applied to eliminate the matrix and spectrum interference. Measurement can be conducted on V>0. 001% and Ti>0.0005% with standard deviation less than 5% and 3% respectively.
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Key words:
- ICP spectrographic analysis /
- vanadium /
- titanium /
- ore /
- material
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